Secondary Ion Mass Spectrometry (SIMS) Imaging
sims
Spectroscopy
Ion
Forward-Model Signal Chain
Each primitive represents a physical operation in the measurement process. Arrows show signal flow left to right.
Spec Notation
S → D
Benchmark Variants & Leaderboards
Secondary Ion Mass Spectrometry (SIMS) Imaging
Secondary Ion Mass Spectrometry (SIMS) Imaging
Spec Notation
S → D
Standard Leaderboard (Top 10)
| # | Method | Score | PSNR (dB) | SSIM | Trust | Source |
|---|---|---|---|---|---|---|
| 🥇 | U-Net-Spectra | 0.780 | 33.16 | 0.954 | ✓ Certified | Spectral U-Net variant |
| 🥈 | ScoreSpectra | 0.765 | 32.48 | 0.948 | ✓ Certified | Wei et al., 2025 |
| 🥉 | Cascade-UNet | 0.761 | 33.0 | 0.922 | ✓ Certified | Physics-informed UNet, 2025 |
| 4 | PINN-Spectra | 0.749 | 31.76 | 0.940 | ✓ Certified | Physics-informed neural network |
| 5 | SpectraFormer | 0.727 | 30.76 | 0.928 | ✓ Certified | Spectroscopy transformer, 2024 |
| 6 | DiffusionSpectra | 0.725 | 30.68 | 0.927 | ✓ Certified | Zhang et al., 2024 |
| 7 | CDAE | 0.723 | 31.5 | 0.895 | ✓ Certified | Zhang et al., Sensors 2024 |
| 8 | PnP-DnCNN | 0.615 | 27.9 | 0.800 | ✓ Certified | Zhang et al., 2017 |
| 9 | Baseline Correction | 0.568 | 25.01 | 0.803 | ✓ Certified | Polynomial fitting baseline |
| 10 | SVD | 0.532 | 23.94 | 0.766 | ✓ Certified | Singular Value Decomposition |
Showing top 10 of 11 methods. View all →
Mismatch Parameters (4) click to expand
| Name | Symbol | Description | Nominal | Perturbed |
|---|---|---|---|---|
| mass_calibration_drift | m_c | Mass calibration drift (ppm) | 0.0 | 1.0 |
| matrix_effect_(sputter_yield) | m_e | Matrix effect (sputter yield) (-) | 0.0 | 10.0 |
| crater_edge_effect | c_e | Crater edge effect (-) | 0.0 | 2.0 |
| charging_(insulating_samples) | c_( | Charging (insulating samples) (V) | 0.0 | 40.0 |