Atomic Force Microscopy (AFM)

afm Scanning Probe Mechanical
View Benchmarks (1)

Forward-Model Signal Chain

Each primitive represents a physical operation in the measurement process. Arrows show signal flow left to right.

S Sampling D Detector
Spec Notation

S → D

Benchmark Variants & Leaderboards

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM)

Full Benchmark Page →
Spec Notation

S → D

Standard Leaderboard (Top 10)

# Method Score PSNR (dB) SSIM Trust Source
🥇 DiffusionAFM 0.795 34.5 0.940 ✓ Certified Diffusion for SPM, 2024
🥈 SPM-Former 0.760 33.0 0.920 ✓ Certified Chen et al., Nano Letters 2024
🥉 Self-Sup AFM 0.723 31.5 0.895 ✓ Certified Self-supervised tip deconvolution, 2023
4 DeepAFM 0.685 30.0 0.870 ✓ Certified Somnath et al., NPJ Comput. Mater. 2021
5 PnP-ADMM 0.577 26.5 0.770 ✓ Certified Venkatakrishnan et al., 2013
6 Wiener Deconv 0.458 23.0 0.650 ✓ Certified Klapetek et al., Meas. Sci. Technol. 2011
7 Plane Fit 0.363 20.0 0.560 ✓ Certified Nečas & Klapetek, Open Physics 2012
Mismatch Parameters (4) click to expand
Name Symbol Description Nominal Perturbed
tip_shape_convolution t_s Tip shape convolution (-) 0.0 0.0
piezo_nonlinearity p_n Piezo nonlinearity (-) 0.0 1.0
thermal_drift t_d Thermal drift (nm/s) 0.0 0.2
scanner_hysteresis s_h Scanner hysteresis (-) 0.0 2.0