Focused Ion Beam SEM (FIB-SEM)
fib_sem
Electron Microscopy
Electron
Forward-Model Signal Chain
Each primitive represents a physical operation in the measurement process. Arrows show signal flow left to right.
Spec Notation
S → C → D
Benchmark Variants & Leaderboards
Focused Ion Beam SEM (FIB-SEM)
Focused Ion Beam SEM (FIB-SEM)
Spec Notation
S → C → D
Standard Leaderboard (Top 10)
| # | Method | Score | PSNR (dB) | SSIM | Trust | Source |
|---|---|---|---|---|---|---|
| 🥇 | DiffFIB | 0.894 | 39.9 | 0.959 | ✓ Certified | Gao et al. 2024 |
| 🥈 | PhysFIB | 0.868 | 38.6 | 0.949 | ✓ Certified | Chen et al. 2024 |
| 🥉 | SwinFIB | 0.845 | 37.5 | 0.939 | ✓ Certified | Wang et al. 2023 |
| 4 | TransFIB | 0.813 | 36.1 | 0.923 | ✓ Certified | Li et al. 2022 |
| 5 | N2V-FIB | 0.759 | 33.8 | 0.891 | ✓ Certified | Krull et al. 2019 |
| 6 | DnCNN-FIB | 0.713 | 31.9 | 0.862 | ✓ Certified | Buchholz et al. 2019 |
| 7 | TV-FIB | 0.652 | 29.4 | 0.825 | ✓ Certified | Rudin et al. 1992 |
| 8 | NLM-FIB | 0.596 | 27.1 | 0.789 | ✓ Certified | Buades et al. 2005 |
| 9 | BM3D-FIB | 0.549 | 25.3 | 0.755 | ✓ Certified | Dabov et al. 2007 |
Mismatch Parameters (4) click to expand
| Name | Symbol | Description | Nominal | Perturbed |
|---|---|---|---|---|
| slice_thickness_variation | s_t | Slice thickness variation (-) | 0.0 | 3.0 |
| curtaining_artifact | c_a | Curtaining artifact (relative) | 0.0 | 0.06 |
| charging | c | Charging (V) | 0.0 | 60.0 |
| drift_between_slices | d_b | Drift between slices (nm) | 0.0 | 1.0 |